(Color online) XRD θ – 2θ patterns of (a) as-grown samples; (b) post-RTA samples.
(Color online) XPS of (a) Te 3d for the as-grown and post-RTA sample D; (b) N 1s lines for the post-RTA sample D and a N monodoped ZnO sample.
(Color online) Raman spectra of all as-grown samples at room temperature. The inset shows the intensity of the ZnTe nLO mode (n = 1, 2, and 3) of all samples.
(Color online) AFM images of (a) a N monodoped ZnO; (b) a Te monodoped ZnO (sample A); (c) a Te-N codoped ZnO (sample B).
(Color online) C-V curves of all Te-N codoped samples after RTA. The insets show the derived N A values for each sample (top right) and a C-V curve of an n-type ZnO wafer (bottom right), respectively.
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