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Electron-stimulated surface chemical reactions on phosphors
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10.1116/1.4808467
/content/avs/journal/jvsta/31/5/10.1116/1.4808467
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/31/5/10.1116/1.4808467
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Figures

Image of FIG. 1.
FIG. 1.

Schematic details of a FED. Note the red, green, and blue sub-pixels defined by photolithography on the anode. The cathode area consists of more than 1000 cold field emitter tips for each subpixel. A sealed vacuum is maintained between the anode and cathode. (Reprinted with permission from Billie Abrams, Ph.D. dissertation, University of Florida (2001). Copyright 2001.)

Image of FIG. 2.
FIG. 2.

Change of CL intensity and Auger electron peak heights from C, O, S, and Zn vs dose (C/cm) for P22B ZnS:Ag phosphor irradiated with 2 keV electrons. [Reprinted with permission from Holloway , J. Appl. Phys. , 483 (2000). Copyright 2000, American Institute of Physics.]

Image of FIG. 3.
FIG. 3.

Plot of CL intensity vs sulfur (S) Auger peak-to-peak height (APPH), showing the good correlation between the decrease in APPH and CL for ZnS:Mn thin film. [Reprinted with permission from Holloway , J. Appl. Phys. , 483 (2000). Copyright 2000, American Institute of Physics.]

Image of FIG. 4.
FIG. 4.

Sulfur APPH vs electron dose showing the correlation between gas pressure and decay rate of CL for a P22B phosphor. (a) Linear plot; (b) logarithmic plot showing exponential decay. [Reprinted with permission from Holloway , J. Appl. Phys. , 483 (2000). Copyright 2000, American Institute of Physics.]

Image of FIG. 5.
FIG. 5.

AES and CL data for ZnS:Ag,Cl powder degraded in 1 × 10 Torr hydrogen ambient. [Reprinted with permission from Abrams , Surf. Sci. , 174 (2000). Copyright 2000, Elsevier.]

Image of FIG. 6.
FIG. 6.

SEM images of the progression of morphological deterioration at ∼30 C/cm in ∼3 × 10 Torr hydrogen as the electron beam power density was increased from 0.4 W/cm to 1.4 W/cm. [Reprinted with permission from Abrams , Surf. Sci. , 174 (2000). Copyright 2000, Elsevier.]

Image of FIG. 7.
FIG. 7.

Schematic diagram of an electron beam-stimulated degradation model showing how SiO nanoparticulates may act as a catalyst for degradation of ZnS powder phosphors in hydrogen by formation of hydroxyl bonds on the surface of nanoparticles of SiO, with subsequent electron dissociation to produce atomic hydrogen that removed sulfur as HS. [Reprinted with permission from Abrams , Surf. Sci. , 174 (2000). Copyright 2000, Elsevier.]

Image of FIG. 8.
FIG. 8.

CL spectrum from (a) undamaged YOS:Eu, (b) undamaged YO:Eu, and (c) YOS:Eu powder after partial conversion to YO:Eu by 2 keV electron bombardment to 30 C/cm. The peaks in (a) and (c) at 617 and 626 nm are from YOS:Eu, while the peak at 612 nm in (b) and (c) is from YO:Eu. [Reprinted with permission from Holloway , J. Appl. Phys. , 483 (2000). Copyright 2000, American Institute of Physics.]

Image of FIG. 9.
FIG. 9.

Relative CL intensity from YOS:Eu powder irradiated by 2 keV electrons to ∼20 C/cm in ∼1 × 10 Torr O which converted the surface layer from YOS:Eu to lower efficiency YO:Eu. Based upon the range of electrons in these materials, the intercept at ∼700 eV corresponds to a dead layer thickness of ∼90 nm, while the intercept of the degraded sample at ∼1300 eV corresponds to a thickness of ∼150 nm. Note that the slope of the intensity vs beam energy is less after electron degradation, suggesting the surface layer is less efficient due to the conversion to the yttrium oxide. [Reprinted with permission from Holloway , J. Appl. Phys. , 483 (2000). Copyright 2000, American Institute of Physics.]

Image of FIG. 10.
FIG. 10.

(Color online) PL and CL before and after degradation of the Sr(PO)F:Eu phosphor. The mechanism of the enhancement of the Eu CL emission is shown in the inset. [Reprinted with permission from Nagpure , Physica B , 1505 (2012). Copyright 2012, Elsevier.]

Image of FIG. 11.
FIG. 11.

CL spectra from a thin film of YSiO:Ce before and after 3 and 24 h of electron bombardment in 1 × 10 Torr O. [Reprinted with permission from Coetsee , J. Lumin. , 37 (2007). Copyright 2007, Elsevier.]

Image of FIG. 12.
FIG. 12.

Resolved XPS peaks from the Si 2p of YSiO:Ce after 24 hr of electron bombardment to cause degradation. [Reprinted with permission from Coetsee , J. Lumin. , 37 (2007). Copyright 2007, Elsevier.]

Image of FIG. 13.
FIG. 13.

Auger peak height ratios of S to Zn (●), O to Zn (♦), and C to Zn (○) showing the decrease of S/Zn and increases of O/Zn and C/Zn over 250 min of exposure to 2 × 10 Torr of CO at RT with electron irradiation. [Reprinted with permission from Darici , J. Vac. Sci. Technol. A , 692 (1999). Copyright 1999, American Vacuum Society.]

Image of FIG. 14.
FIG. 14.

SEM micrographs of TaZnO thin film ‘burn spot’ from primary electrons beam (background pressure: 1 × 10 Torr, electron beam energy: 2 keV, current density: 0.27 mA/cm). [Reprinted with permission from Kondoleon , J. Vac. Sci. Technol. A , 2699 (2000). Copyright 2000, American Vacuum Society.]

Image of FIG. 15.
FIG. 15.

CL intensity as a function of coulomb dose (C/cm) for TaZnO thin film in a vacuum containing an excess of carbon. (a) Thin film with graphite paint on the surface,  1 × 10 Torr (initial) to 9 × 10 Torr (final), and (b) thin film without graphite paint on the surface,  9 × 10 Torr (initial) to 2 × 10 Torr (final). ( = 2 keV 8.5A; current density = 2.7 × 10 A/cm). [Reprinted with permission from Kondoleon , J. Vac. Sci. Technol. A , 2699 (2000). Copyright 2000, American Vacuum Society.]

Image of FIG. 16.
FIG. 16.

AES depth profile of an area of TaZnO (with grid) thin film exposed to the electron beam. Carbon was the only element detected at the surface of the thin film. [Reprinted with permission from Kondoleon , J. Vac. Sci. Technol. A , 2699 (2000). Copyright 2000, American Vacuum Society.]

Image of FIG. 17.
FIG. 17.

Cathodoluminescence intensity as a function of wavelength for uncoated YO:Eu powder and YO:Eu powder coated with 130 Å of MgO. The beam current was kept constant at 0.16 mA/cm, while the accelerating voltage was varied from 0.8 to 4 keV. [Reprinted with permission from Thomes , J. Appl. Phys. , 9657 (2002). Copyright 2002, American Institute of Physics.]

Image of FIG. 18.
FIG. 18.

Luminescence intensity as a function of beam voltage for a 430 Å coating of MgO on YSiO:Tb powder. Curves are shown for the measured cathodoluminescence from both the coated and uncoated phosphor, as well as calculated cathodoluminescence intensity from the coated sample using the Rao–Sahib and Wittry stopping power equation. [Reprinted with permission from Thomes , J. Appl. Phys. , 9657 (2002). Copyright 2002, American Institute of Physics.]

Image of FIG. 19.
FIG. 19.

Normalized relative CL intensity measured during degradation for: (a) CdO coated and (b) bare ZnS:Cu,Au,Al thin film phosphor. [Reprinted with permission from Hillie , Appl. Surf. Sci. , 137 (2002). Copyright 2002, Elsevier.]

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2013-06-12
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electron-stimulated surface chemical reactions on phosphors
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/31/5/10.1116/1.4808467
10.1116/1.4808467
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