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Probing ultrathin film continuity and interface abruptness with x-ray photoelectron spectroscopy and low-energy ion scattering
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10.1116/1.4812695
/content/avs/journal/jvsta/31/6/10.1116/1.4812695
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/31/6/10.1116/1.4812695
/content/avs/journal/jvsta/31/6/10.1116/1.4812695
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/content/avs/journal/jvsta/31/6/10.1116/1.4812695
2013-07-03
2014-07-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Probing ultrathin film continuity and interface abruptness with x-ray photoelectron spectroscopy and low-energy ion scattering
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/31/6/10.1116/1.4812695
10.1116/1.4812695
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