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Second-harmonic intensity and phase spectroscopy as a sensitive method to probe the space-charge field in Si(100) covered with charged dielectrics
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10.1116/1.4862145
/content/avs/journal/jvsta/32/2/10.1116/1.4862145
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/32/2/10.1116/1.4862145
/content/avs/journal/jvsta/32/2/10.1116/1.4862145
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/content/avs/journal/jvsta/32/2/10.1116/1.4862145
2014-02-04
2014-09-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Second-harmonic intensity and phase spectroscopy as a sensitive method to probe the space-charge field in Si(100) covered with charged dielectrics
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/32/2/10.1116/1.4862145
10.1116/1.4862145
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