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Effect of annealing treatment on the electrical characteristics of Pt/Cr-embedded ZnO/Pt resistance random access memory devices
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10.1116/1.4865551
/content/avs/journal/jvsta/32/2/10.1116/1.4865551
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/32/2/10.1116/1.4865551
/content/avs/journal/jvsta/32/2/10.1116/1.4865551
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/content/avs/journal/jvsta/32/2/10.1116/1.4865551
2014-02-19
2014-11-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of annealing treatment on the electrical characteristics of Pt/Cr-embedded ZnO/Pt resistance random access memory devices
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/32/2/10.1116/1.4865551
10.1116/1.4865551
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