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Planar regions of GaAs (001) prepared by Ga droplet motion
D. E. Jesson and W. X. Tang, Microscopy: Science, Technology, Applications and Education, edited by A. Mendez-Vilas and J. Diaz ( Formatex Research Center, Badajoz, 2010), Vol. 3, p. 1608.
J. Y. Tsao, Materials Fundamentals of Molecular Beam Epitaxy ( Academic, San Diego, CA, 1993).
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The authors describe a simple method for obtaining planar regions of GaAs (001) suitable for surface science studies. The technique, which requires no buffer layer growth, atomic hydrogen source, or the introduction of As flux, employs controllable Ga droplet motion to create planar trail regions during Langmuir evaporation. Low-energy electron microscopy/diffraction techniques are applied to monitor the droplet motion and characterize the morphology and the surface reconstruction. It is found that the planar regions exhibit atomic flatness at the level of a high-quality buffer layer.
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