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Summary Abstract: Chemical analysis of i n s i t u fractured materials by x‐ray photoelectron spectroscopy, Auger electron spectroscopy, and ion scattering spectroscopy
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10.1116/1.574634
/content/avs/journal/jvsta/5/4/10.1116/1.574634
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/5/4/10.1116/1.574634
/content/avs/journal/jvsta/5/4/10.1116/1.574634
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/content/avs/journal/jvsta/5/4/10.1116/1.574634
1987-07-01
2014-11-27
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Summary Abstract: Chemical analysis of insitu fractured materials by x‐ray photoelectron spectroscopy, Auger electron spectroscopy, and ion scattering spectroscopy
http://aip.metastore.ingenta.com/content/avs/journal/jvsta/5/4/10.1116/1.574634
10.1116/1.574634
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