NOTICE:

AIP Publishing will apply a patch on 07-MAY-2015 at 10pm China time to its manuscript submission and processing system (PXP) to correct an intermittent connectivity issue for users in China. Ahead of this patch if you have any urgent issues please contact us at http://help.peerx-press.org/

为中国用户提供论文投稿系统 (PXP)的更新 AIP出版公司将于2015年5月7日晚上10点(北京时间)为中国用户提供论文投稿系统(PXP)的补丁用以修正前期出现的连接问题。 在补丁发布之前,如您有紧急问题请与我们联系: http://help.peerx-press.org/

Thank you for your patience during this process.

1887
banner image
image of Journal of Vacuum Science & Technology B
ISSN: 2166-2746
E-ISSN: 2166-2754

Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.

To re-register for Table of Content Alerts, please click here.

Editor's Picks

  • Conductance fluctuations in graphene subjected to short-range disorder
  • Transient measurements of carrier relaxation time and density in the P3HT:PCBM organic photovoltaic cell
  • Surface analytical investigation on organometal triiodide perovskite
  • Large-scale fabrication of a simple cubic metal-oxide photonic crystal for light-trapping applications
  • Level-set multilayer growth model for predicting printability of buried native extreme ultraviolet mask defects

Latest Articles

Cover image Placeholder
ISSN: 2166-2746
E-ISSN: 2166-2754

Agency: AVS: Science & Technology of Materials, Interfaces, and Processing

This is a required field
Please enter a valid email address

Oops! This section, does not exist...

Use the links on this page to find existing content.

02c42c7313f5e0851ceededdf19fdb72 journal.journalzxybnytfddd
Scitation: Journal of Vacuum Science & Technology B: Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
http://aip.metastore.ingenta.com/content/avs/journal/jvstb
BROWSE_VIEW_LIST