1887
banner image
image of Journal of Vacuum Science & Technology B
ISSN: 2166-2746
E-ISSN: 2166-2754

Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.

To re-register for Table of Content Alerts, please click here.

Editor's Picks

  • Improvement of drain breakdown voltage with a back-side gate on AlGaN/GaN high electron mobility transistors
  • Conductance fluctuations in graphene subjected to short-range disorder
  • Domain fracture and recovery process of metal phthalocyanine monolayers via NO2 and H2O
  • Transient measurements of carrier relaxation time and density in the P3HT:PCBM organic photovoltaic cell
  • Surface analytical investigation on organometal triiodide perovskite

Latest Articles

Cover image Placeholder
ISSN: 2166-2746
E-ISSN: 2166-2754

Agency: AVS: Science & Technology of Materials, Interfaces, and Processing

This is a required field
Please enter a valid email address

Oops! This section does not exist...

Use the links on this page to find existing content.

02c42c7313f5e0851ceededdf19fdb72 journal.journalzxybnytfddd
Scitation: Journal of Vacuum Science & Technology B: Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
http://aip.metastore.ingenta.com/content/avs/journal/jvstb
BROWSE_VIEW_LIST