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Strain in AlGaN layer studied by Rutherford backscattering/channeling and x-ray diffraction
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10.1116/1.590780
/content/avs/journal/jvstb/17/4/10.1116/1.590780
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/17/4/10.1116/1.590780
/content/avs/journal/jvstb/17/4/10.1116/1.590780
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/content/avs/journal/jvstb/17/4/10.1116/1.590780
1999-07-01
2015-08-05
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Strain in AlGaN layer studied by Rutherford backscattering/channeling and x-ray diffraction
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/17/4/10.1116/1.590780
10.1116/1.590780
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