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Characterization and nanometer-scale modifications of surface via atomic force microscopy
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10.1116/1.591359
/content/avs/journal/jvstb/18/3/10.1116/1.591359
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/18/3/10.1116/1.591359
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/content/avs/journal/jvstb/18/3/10.1116/1.591359
2000-05-01
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization and nanometer-scale modifications of Bi2Te3 surface via atomic force microscopy
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/18/3/10.1116/1.591359
10.1116/1.591359
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