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Reliable Ti/Al and Ti/Al/Ni/Au ohmic contacts to n-type GaN formed by vacuum annealing
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10.1116/1.1331291
/content/avs/journal/jvstb/19/1/10.1116/1.1331291
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/19/1/10.1116/1.1331291
/content/avs/journal/jvstb/19/1/10.1116/1.1331291
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/content/avs/journal/jvstb/19/1/10.1116/1.1331291
2001-01-01
2014-09-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Reliable Ti/Al and Ti/Al/Ni/Au ohmic contacts to n-type GaN formed by vacuum annealing
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/19/1/10.1116/1.1331291
10.1116/1.1331291
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