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Two-dimensional profiling of carriers in a buried heterostructure multi-quantum-well laser: Calibrated scanning spreading resistance microscopy and scanning capacitance microscopy
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10.1116/1.1511211
/content/avs/journal/jvstb/20/5/10.1116/1.1511211
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/20/5/10.1116/1.1511211
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/content/avs/journal/jvstb/20/5/10.1116/1.1511211
2002-10-04
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Two-dimensional profiling of carriers in a buried heterostructure multi-quantum-well laser: Calibrated scanning spreading resistance microscopy and scanning capacitance microscopy
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/20/5/10.1116/1.1511211
10.1116/1.1511211
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