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Comparison of atomic force microscopy imaging methods and roughness determinations for a highly polished quartz surface
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10.1116/1.1513633
/content/avs/journal/jvstb/20/6/10.1116/1.1513633
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/20/6/10.1116/1.1513633
/content/avs/journal/jvstb/20/6/10.1116/1.1513633
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/content/avs/journal/jvstb/20/6/10.1116/1.1513633
2002-12-09
2014-07-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Comparison of atomic force microscopy imaging methods and roughness determinations for a highly polished quartz surface
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/20/6/10.1116/1.1513633
10.1116/1.1513633
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