FTIR absorbance spectrum of a typical Sn–DLC film deposited on Si substrate.
X-ray diffraction pattern of the Sn–DLC film on glass substrate deposited with per of methanol.
(a) TEM image of a Sn–DLC film deposited with per of methanol. (b) Electron diffraction pattern of the film.
Optical gap of the films at different Sn concentrations.
Hardness of the films with different Sn concentrations.
Conductivity of the films measured as a function of temperature for different Sn concentrations (a) 0, (b) 250, (c) 350, (d) 400, and (e) per of methanol.
Room temperature resistivity and activation energies of the films deposited with different Sn concentrations.
Emission current density against electric field from (a) undoped and Sn incorporated DLC films with nominal Sn concentrations of (b) 250, (c) 350, (d) 400, and (e) per of methanol.
Variation of turn-on field with Sn concentrations.
F–N plots of undoped and Sn-doped DLC films with Sn concentrations of (a) 250, (b) 350, (c) 400, and (d) per of methanol.
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