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Imaging of thickness and compositional fluctuations in quantum wells by scanning capacitance microscopy
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10.1116/1.1947799
/content/avs/journal/jvstb/23/4/10.1116/1.1947799
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/23/4/10.1116/1.1947799
/content/avs/journal/jvstb/23/4/10.1116/1.1947799
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/content/avs/journal/jvstb/23/4/10.1116/1.1947799
2005-07-25
2014-10-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Imaging of thickness and compositional fluctuations in InGaN∕GaN quantum wells by scanning capacitance microscopy
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/23/4/10.1116/1.1947799
10.1116/1.1947799
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