Monolithic organic-oxide microcavities fabricated by low-temperature electron-beam evaporation
Surface morphology of the samples: (a), (b), (c), and (d). HT and LT indicate high and low deposition, respectively.
Transmission spectra of single dielectric layers evaporated at low temperature, (a) and (b). The transfer matrix fitting curves (solid lines) are superimposed to experimental data (empty dots). The achieved thickness is of about 180 and for the and the layer, respectively.
(a) Refractive index vs wavelength of (full squares and empty squares) and (full circles and empty circles) growth, respectively, at and at room temperature. (b) Transmission spectra of the DBR mirrors realized by alternating 5.5 couples of evaporated at low . Circles: experimental data. Solid curve: theoretical prediction.
Transmission spectra of the organic -cavities with two cavity layers of thickness (a) and (b). Inset of (b): Schematic structure of the device.
Surface morphology characteristics, refractive indexes, and Cauchy parameters [Eq. (2)] of the evaporated compounds. The errors on the fitting parameters are smaller than the last reported digit.
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