Local characterization of vapor-deposited electrode edges in thin film organic electronic devices
Cross-point architecture for thermal vapor-deposited electrodes with a conjugated polymer (HTPA) active layer. Electrode geometry was configured with shadow masks, and the transition region across the mask edge is investigated.
Scanning probe microscopy characterization of electrode edge after thermal vapor deposition of aluminum onto a conjugated polymer and onto gold. (a) Topography and (b) surface potential of Al on polymer; (c) topography and (d) surface potential of Al on Au. In all images the Al is thickest on the left. The topography images were line by line flattened, and the line traces represent an average over the image height (256 lines), excluding the contaminant particle in (a).
SPM images of electrode edge interfaces for vapor-deposited aluminum. (a) Topography and (b) surface potential for Al on HTPA; (c) topography and (d) surface potential of Al on Au. Image areas are .
Cross-sectional TEM image of aluminum evaporated onto the HTPA polymer reveals five distinct layers within the aluminum film.
Continuous distributions of aluminum and gold across the Al–Au interface are confirmed with scanning Auger spectroscopy [image ; location corresponds to the interfacial region in Fig. 3(d) and gray scale indicates elemental peak intensities (arbitrary units)].
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