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Process for scanning near-field microwave microscope probes with integrated ultratall coaxial tips
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10.1116/1.2721571
/content/avs/journal/jvstb/25/3/10.1116/1.2721571
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/25/3/10.1116/1.2721571
/content/avs/journal/jvstb/25/3/10.1116/1.2721571
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/content/avs/journal/jvstb/25/3/10.1116/1.2721571
2007-05-01
2014-10-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Process for scanning near-field microwave microscope probes with integrated ultratall coaxial tips
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/25/3/10.1116/1.2721571
10.1116/1.2721571
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