SEM images (52° tilted) of (a), (b) Ni catalysts after electroplating process and (c), (d) CNFs grown by dc-PECVD on substrates with and without Ti buffer layer, respectively.
Surface morphologies by SEM evolved during the Ni electroplating process on /glass under electroplating times of (a) , (b) , (c) , and (d) . The insets are SEM images corresponding to the surface morphologies of CNFs grown by dc-PECVD for each Ni electroplating time.
TEM image of CNF grown by dc-PECVD for the sample under Ni-electroplating time of . The inset is the magnified TEM image of CNF body.
Typical Raman spectrum of CNFs grown by dc-PECVD.
(a) Emission current density vs applied electric field curves of samples with different CNF densities and (b) the corresponding FN plots of the emission data.
Phosphor screen images obtained from samples with different Ni-electroplating times of 30, 60, 120, and .
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