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Synthesis and characterization of nanocomposites
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10.1116/1.2939262
/content/avs/journal/jvstb/26/4/10.1116/1.2939262
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/26/4/10.1116/1.2939262

Figures

Image of FIG. 1.
FIG. 1.

(a) Standard peak positions of rutile, anatase, and Ge and XRD patterns from the samples obtained from target deposited at (b) , samples S1, S2, and S3; (c) , samples S4, S5, and S6; and (d) , samples S7, S8, and S9.

Image of FIG. 2.
FIG. 2.

High-resolution XPS scan of Ge region for (a) pure germanium wafer, (b) samples deposited at , (c) samples deposited at , and (d) sample deposited at . peak positions of Ge, , and are 28.95, 32.5, and , respectively.

Image of FIG. 3.
FIG. 3.

High-resolution XPS spectrum for the Ti region.

Image of FIG. 4.
FIG. 4.

Plane view bright field image of Ge nanocrystals embedded in matrix in samples (a) S5 (, ) and (b) S9 (, ).

Image of FIG. 5.
FIG. 5.

Log normal fit for the particle size distribution of sample S9 obtained using the bright field TEM image shown in Fig. 4(b).

Tables

Generic image for table
TABLE I.

Samples from target : : with deposition parameters specified.

Generic image for table
TABLE II.

Comparison of reference and calculated lattice parameters of rutile, anatase, and Ge.

Generic image for table
TABLE III.

Quantitative analyses of XRD results.

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/content/avs/journal/jvstb/26/4/10.1116/1.2939262
2008-08-12
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Synthesis and characterization of TiO2–Ge nanocomposites
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/26/4/10.1116/1.2939262
10.1116/1.2939262
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