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Noncontact lateral-force gradient measurement on surface with small-amplitude off-resonance atomic force microscopy
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10.1116/1.3097857
/content/avs/journal/jvstb/27/2/10.1116/1.3097857
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/27/2/10.1116/1.3097857
/content/avs/journal/jvstb/27/2/10.1116/1.3097857
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/content/avs/journal/jvstb/27/2/10.1116/1.3097857
2009-04-01
2015-01-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/27/2/10.1116/1.3097857
10.1116/1.3097857
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