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Resonant structures based on amorphous silicon suboxide doped with with silicon nanoclusters for an efficient emission at
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10.1116/1.3246406
/content/avs/journal/jvstb/27/6/10.1116/1.3246406
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/27/6/10.1116/1.3246406
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Photoluminescence spectra in the region for samples submitted to different temperatures. (b) Photoluminescence spectra in the region for samples with no annealing and with different annealing temperatures. Maximum PL intensity occurs for a sample annealed ate (open circles) and at (solid line).

Image of FIG. 2.
FIG. 2.

Transmission electron microscopy micrograph of Si nanocluster obtained after annealing at for . (a) Lower magnification micrograph showing a typical distribution of crystalline clusters. (b) Higher magnification micrograph showing a diameter crystalline cluster.

Image of FIG. 3.
FIG. 3.

Calculated optical field intensity within the layer as a function of wavelength. (a) thickness of ; (b) thickness of ; (c) thickness of . Gray rectangles are placed approximately to represent the pumping/emission wavelength with associate linewidth.

Image of FIG. 4.
FIG. 4.

PL enhancement, defined as the ratio between the PL intensity and the best PL result for the sample without the layer. (a) Emission in the region as a function of thickness. (b) Emission in the region as a function of thickness.

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/content/avs/journal/jvstb/27/6/10.1116/1.3246406
2009-10-22
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Resonant structures based on amorphous silicon suboxide doped with Er3+ with silicon nanoclusters for an efficient emission at 1550nm
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/27/6/10.1116/1.3246406
10.1116/1.3246406
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