(a) Photoluminescence spectra in the region for samples submitted to different temperatures. (b) Photoluminescence spectra in the region for samples with no annealing and with different annealing temperatures. Maximum PL intensity occurs for a sample annealed ate (open circles) and at (solid line).
Transmission electron microscopy micrograph of Si nanocluster obtained after annealing at for . (a) Lower magnification micrograph showing a typical distribution of crystalline clusters. (b) Higher magnification micrograph showing a diameter crystalline cluster.
Calculated optical field intensity within the layer as a function of wavelength. (a) thickness of ; (b) thickness of ; (c) thickness of . Gray rectangles are placed approximately to represent the pumping/emission wavelength with associate linewidth.
PL enhancement, defined as the ratio between the PL intensity and the best PL result for the sample without the layer. (a) Emission in the region as a function of thickness. (b) Emission in the region as a function of thickness.
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