Structural, electrical, and optical characterizations of laser deposited nanometric iron oxide films
GIXRD spectra of the samples deposited at (a) 0.05 Pa and (b) 1.0 Pa.
SEM micrographs of the sample deposited at . The white marks correspond to .
(Color online) XRR spectra of the samples deposited at (a) 0.05 Pa and (b) 1.0 Pa.
Arrhenius plots of vs . From the best fit of the experimental points, the energy gap values were calculated for films deposited at different oxygen pressures: (1) : ; (2) : ; (3) : ; (4) : .
(Color online) Plot of vs for films deposited on substrates at different oxygen pressures.
Relative electrical resistance of the film deposited at vs 0.1% NO gas mixture pressure at 290 K.
Thickness and mean composition of the RPLD deposited samples, obtained from RBS spectra, electric energy gap , determined by specific conductivity measurements with an applied electric field of 45 V/m and thermo-emf coefficient .
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