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Growth, characterization, and uniformity analysis of 200 mm wafer-scale
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10.1116/1.3292509
/content/avs/journal/jvstb/28/3/10.1116/1.3292509
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/28/3/10.1116/1.3292509
/content/avs/journal/jvstb/28/3/10.1116/1.3292509
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/content/avs/journal/jvstb/28/3/10.1116/1.3292509
2010-04-06
2014-08-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Growth, characterization, and uniformity analysis of 200 mm wafer-scale SrTiO3/Si
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/28/3/10.1116/1.3292509
10.1116/1.3292509
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