(Color online) Schematic for diffractive light trapping with a patterned dielectric back reflector. The metallization on the backside of the dielectric is not shown, nor are the SiN antireflection layers on both Si surfaces. See text for further explanation.
(Color online) AFM topographies and profile along the white lines for (a) a square grating imprinted with an ETFE mold and (b) a sinusoidal grating imprinted with an epoxy mold.
(Color online) Hemispherical reflection data for grating and flat reference reflectors for TE and TM polarized light. (a) Square grating and flat reference reflectors and (b) sinusoidal grating and flat reference reflectors. Insets: schematic of sample geometry and light polarization ( -vectors) for TE and TM.
(Color online) Circles: experimental (TE) data from Fig. 3 . Lines: ray-tracing model (see text for details). (a) Square grating and flat reference reflectors and (b) sinusoidal grating and flat reference reflectors.
(Color online) Calculated total reflection at dielectric/silver flat and two grating interfaces. The curves for both gratings for TE polarization are identical to the curve for the flat reflector for both polarizations (labeled ‘‘TE’’). The square and sinusoidal gratings have lower reflection values in TM mode.
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