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Nondestructive detection of deviation in integrated circuits
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10.1116/1.3518464
/content/avs/journal/jvstb/28/6/10.1116/1.3518464
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/28/6/10.1116/1.3518464
/content/avs/journal/jvstb/28/6/10.1116/1.3518464
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/content/avs/journal/jvstb/28/6/10.1116/1.3518464
2010-12-02
2014-09-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nondestructive detection of deviation in integrated circuits
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/28/6/10.1116/1.3518464
10.1116/1.3518464
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