Reliability studies on high- dielectric metal-insulator-metal capacitors prepared by wet anodization
(Color online) Variation of characteristics with temperature.
(Color online) Poole–Frenkel plots at positive applied voltage.
Arrhenius plot of extrapolated at zero applied field.
(Color online) (a) Arrhenius plots of and (b) Poole–Frenkel coefficient .
Arrhenius plot of modified Poole–Frenkel coefficient .
(Color online) Constant voltage stress on tantalum oxide MIM devices showing early breakdown.
(a) Variation of time to breakdown, (b) charge to breakdown, and (c) current at breakdown with stress voltage.
(Color online) Variation of voltage to retain the constant current with time.
(Color online) characteristics after applying constant current stress. The magnified graphs at low fields in (a) are shown in (b).
(Color online) Effect of stress time on oxide leakage current after constant current stress.
(Color online) Variation of high frequency capacitance-voltage (HFCV) with constant current stress for 100 s.
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