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measurements on stack metal-oxide-semiconductor capacitor using a new three-pulse technique
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10.1116/1.3533267
/content/avs/journal/jvstb/29/1/10.1116/1.3533267
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/29/1/10.1116/1.3533267
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Three-pulse measurement setup.

Image of FIG. 2.
FIG. 2.

Input and output wave forms of two-pulse for (a) and and (b) and .

Image of FIG. 3.
FIG. 3.

(Color online) Two-pulse plots for and .

Image of FIG. 4.
FIG. 4.

Energy band diagram of device at negative voltage applied to the gate electrode.

Image of FIG. 5.
FIG. 5.

Input and output wave forms of three-pulse technique for and .

Image of FIG. 6.
FIG. 6.

(Color online) Three-pulse plots for .

Image of FIG. 7.
FIG. 7.

(Color online) Variation of plots after discharge with discharge time.

Image of FIG. 8.
FIG. 8.

(Color online) Variation of (a) flat-band voltage shift and (b) normalized flat-band voltage shift with discharge time.

Image of FIG. 9.
FIG. 9.

(Color online) plots measured at (a) ramp 2 and (b) ramp 3 at various charge time; (c) variation of flat-band voltage shift with charge time.

Image of FIG. 10.
FIG. 10.

(Color online) Variation of plots measured at (a) ramp 2 and (b) ramp 3 with pulse amplitude.

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/content/avs/journal/jvstb/29/1/10.1116/1.3533267
2011-01-11
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: CV measurements on LaLuO3 stack metal-oxide-semiconductor capacitor using a new three-pulse technique
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/29/1/10.1116/1.3533267
10.1116/1.3533267
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