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Nanoscale depth-resolved electronic properties of for device-tolerant electronics
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10.1116/1.3543712
/content/avs/journal/jvstb/29/1/10.1116/1.3543712
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/29/1/10.1116/1.3543712
/content/avs/journal/jvstb/29/1/10.1116/1.3543712
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/content/avs/journal/jvstb/29/1/10.1116/1.3543712
2011-01-14
2014-10-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanoscale depth-resolved electronic properties of SiO2/SiOx/SiO2 for device-tolerant electronics
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/29/1/10.1116/1.3543712
10.1116/1.3543712
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