SEM images of the CNT emitter array. (a) Vertically aligned CNT emitters. (b) Array of silicon coated CNT emitters with islands and pitch. (b) A magnified image of one silicon coated CNT emitter. (c) A magnified image of the tip apex of a silicon coated CNT emitter.
SEM images of (a) cross-sectioned and (b) horizontally cross-sectioned silicon coated CNT emitter.
(Color online) TEM images of silicon coated CNT emitters horizontally cross sectioned with a focused ion beam. (a) Sample preparation area. (b) Sample slice model image. (c) TEM image of the slice. (d) Magnified image of the bright area in (c). (e) Magnified image of (d).
(Color online) TEM images of vertically cross-sectioned silicon coated CNT emitters and elemental analysis along the CNT height. (a) A TEM image of the prepared sample and the sampling position (inset). (b) A high-resolution TEM image of the rectangular area in (a). (c) A TEM image and the scan line for the element analysis. (d) The relative concentration of carbon and silicon through the scan line.
(Color online) Schematic diagram of the silicon coated CNT emitter growth process. (a) Aggregation of the nickel catalyst after the high temperature forming process. (b) CNT growth in early growth stages . (c) Robust CNT growth after 40 min growth time. (d) Silicon coated CNT growth. The CNT shows a nanometer-scaled tip apex and a micrometer-scaled base.
(a) Electron emission properties and (b) emission current stability of the CNT emitters.
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