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New approach for measuring protrusive forces in cells
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10.1116/1.3655580
    + View Affiliations - Hide Affiliations
    Affiliations:
    1 Department of Mechanical Engineering and Nanomedicine Center for Mechanobiology Directing the Immune Response, Columbia University, New York, New York 10027
    2 Department of Biological Sciences, Columbia University, New York, New York 10027 and Institute forBioengineering of Catalonia and University of Barcelona, Barcelona, Spain 08028
    3 Univ. de Bordeaux, Interdisciplinary Institute for Neuroscience and CNRS, Interdisciplinary Institute for Neuroscience, UMR 5297, F-33000 Bordeaux, France
    4 Department of Applied Physics and Applied Mathematics and Nanomedicine Center for Mechanobiology Directing the Immune Response, Columbia University, New York, New York 10027
    5 Department of Biological Sciences and Nanomedicine Center for Mechanobiology Directing the Immune Response, Columbia University, New York, New York 10027
    6 Department of Mechanical Engineering and Nanomedicine Center for Mechanobiology Directing theImmuneResponse, Columbia University, New York, New York 10027
    a) Electronic mail: sw2128@columbia.edu
    J. Vac. Sci. Technol. B 29, 06FA02 (2011); http://dx.doi.org/10.1116/1.3655580
/content/avs/journal/jvstb/29/6/10.1116/1.3655580
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/29/6/10.1116/1.3655580
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Force sensor device in silicone elastomer (PDMS). Top view in which pillar diameter d = 1 μm and distance between edge of pad and pillar (d1, d2) = 3 and 2 μm, respectively. Protrusive forces were measured on the block of pillars where the cell first makes contact, i.e., the pillars to the right of the dashed line.

Image of FIG. 2.
FIG. 2.

(Color online) Schematic diagram illustrating the fabrication of the force sensor in PDMS with pillars higher than nearby pads.

Image of FIG. 3.
FIG. 3.

Cross-sectioned scanning electron microscope image of force sensor in the silicon mold after fabrication. The holes are ∼150 nm deeper than nearby pads. Stage tilt: 90°. Scale bar = 1 μm.

Image of FIG. 4.
FIG. 4.

(Color online) Scanning electron micrograph of cell on top of the device. The cell edge on the pillars has been outlined. Samples were critical point dried. The debris seen in this image is due to the critical point drying process. Scale bar = 25 μm.

Image of FIG. 5.
FIG. 5.

(Color online) Representative traces of protrusive force exerted by a cell on pillars. The x-axis denotes the time in minutes, and the y-axis is the protrusive force in nano-Newtons (nN).

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/content/avs/journal/jvstb/29/6/10.1116/1.3655580
2011-11-11
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: New approach for measuring protrusive forces in cells
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/29/6/10.1116/1.3655580
10.1116/1.3655580
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