(Color online) Schematic of the proposed “drag assay” for which the micron-scale retroreflectors have been developed.
(Color online) Schematic of the fabrication sequence for corner cube retroreflectors used in this work.
Scanning electron micrographs of corner cube retroreflectors.
Retroreflecting corner-cubes imaged (a) in solution, and (b) at fixed locations on a silicon wafer using an 8×, 0.1 NA optical microscope.
From the top left to the bottom right, the retroreflector cube (bright spot) and magnetic particles (dark spots) move in response to the presence of an external magnet. The time elapsed between frames is 1 s.
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