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Suspended, micron-scale corner cube retroreflectors as ultra-bright optical labels
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10.1116/1.3656801
/content/avs/journal/jvstb/29/6/10.1116/1.3656801
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/29/6/10.1116/1.3656801
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Schematic of the proposed “drag assay” for which the micron-scale retroreflectors have been developed.

Image of FIG. 2.
FIG. 2.

(Color online) Schematic of the fabrication sequence for corner cube retroreflectors used in this work.

Image of FIG. 3.
FIG. 3.

Scanning electron micrographs of corner cube retroreflectors.

Image of FIG. 4.
FIG. 4.

Retroreflecting corner-cubes imaged (a) in solution, and (b) at fixed locations on a silicon wafer using an 8×, 0.1 NA optical microscope.

Image of FIG. 5.
FIG. 5.

From the top left to the bottom right, the retroreflector cube (bright spot) and magnetic particles (dark spots) move in response to the presence of an external magnet. The time elapsed between frames is 1 s.

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/content/avs/journal/jvstb/29/6/10.1116/1.3656801
2011-11-03
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Suspended, micron-scale corner cube retroreflectors as ultra-bright optical labels
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/29/6/10.1116/1.3656801
10.1116/1.3656801
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