1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Near-edge x-ray absorption fine structure spectroscopy studies of charge redistribution at graphene/dielectric interfaces
Rent:
Rent this article for
USD
10.1116/1.4726508
/content/avs/journal/jvstb/30/4/10.1116/1.4726508
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/30/4/10.1116/1.4726508
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Raman spectra acquired using 514.5 nm laser excitation for as-grown SLG/Cu, transferred SLG on SiO2, and double-oxide dielectric/graphene/SiO2 heterostructures where the top layer is ZrO2, TiO2, TiN, or HfO2. All spectra have been baseline corrected and normalized to the G band. An increase in the intensity of the D band is representative of a large number of defect-induced states; corroborated with a diminished 2D band.

Image of FIG. 2.
FIG. 2.

(Color online) Carbon K-edge NEXAFS spectra collected at several angles for transferred graphene, and graphene–dielectric interfaces. (a) Single-layered graphene at all angles, where the relative intensities of the π* and σ* resonances denote a high degree of anisotropy after transfer on 300 nm SiO2/Si. (b)–(d) NEXAFS spectra of graphene interfaces acquired for graphene on SiO2 with ZrO2, TiO2, TiN, and HfO2 overlayers. The spectra are compared at three different angles of the incident x rays: (b) 25°, (c) 54.7°, and (d) 85°.

Image of FIG. 3.
FIG. 3.

(Color online) Ab initio excited-state core–hole (XCH) spectra calculated for a neutral 200 atom graphene supercell and upon the addition of electrons (3 , 2 , 1 ) or holes (1 + , 2 + , 3 + ). The alignment of the spectra is discussed in the Methods section. The subtle shifts in intensity and peak position of the π* resonance denote changes to the unoccupied density of states near the Fermi level as discussed in the Results and Discussion Section B.

Loading

Article metrics loading...

/content/avs/journal/jvstb/30/4/10.1116/1.4726508
2012-06-13
2014-04-19
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Near-edge x-ray absorption fine structure spectroscopy studies of charge redistribution at graphene/dielectric interfaces
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/30/4/10.1116/1.4726508
10.1116/1.4726508
SEARCH_EXPAND_ITEM