banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Nanofabricated quantum dot array formation through annealing of nano-patterned planar InAs
Rent this article for


Image of FIG. 1.
FIG. 1.

Relative volume of quantum dots compared to a 25 nm base width pyramid, which would be formed from various grid geometries. The various lines correspond to constant volume plots. The number associated with the line is the relative volume.

Image of FIG. 2.
FIG. 2.

2 μm × 2 μm AFM images of annealed planar InAs patterns produced using (a) 75 and (b) 100 lines per pattern. The corresponding areas are shown in (c) and (d), and height distributions are shown in (e) and (f).

Image of FIG. 3.
FIG. 3.

High resolution transmission electron micrograph of our planar InAs layer is shown here. The associated Lomer dislocations are indicated by white arrows. The inset in the upper left shows the magnified image around the core of the dislocation. For this film, the average spacing between Lomer dislocations is ∼7.4 nm. The distance between atomic positions along the interface is 0.4 nm.

Image of FIG. 4.
FIG. 4.

Bright field (G = 220) cross-sectional TEM of a planar InAs region after annealing (images taken with a TEM operated at 300 kV). The GaAs substrate is located at the lower left of the image and the InAs TSBPs are shown in the middle of the image (three are highlighted with arrows). No strain fields from dislocations are apparent in the GaAs substrate at the interface between the GaAs and InAs features (WL and InAs TSBP). In addition, no apparent damage is visible in the InAs TSBP.

Image of FIG. 5.
FIG. 5.

(Color) Images acquired from μPL mapping for various patterns on the sample. The maps were taken with ∼1 μm steps, which causes the apparent pixilation. (a) Confocal optical image of the mapped area. Image (b) has an overlaid map for intensity of peak at 914 nm. The color scale ranges from 400 for blue up to 800 for red. Image (c) has overlaid map for intensity of peak at 1040 nm. The color scale ranges from 200 for blue up to 475 for red.


Generic image for table

AFM analysis of the QD distribution.


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanofabricated quantum dot array formation through annealing of nano-patterned planar InAs