(Color online) (A) Image and line profile of a set of dots in the √3 surface, before Ag deposition. Image size 50 × 50 nm2. Imaged at 0.2 V, 2 nA. (B)Image and line profile of a pit created in the √3 surface, before Ag deposition. Image size 50 × 50 nm2. Imaged at −0.2 V tip bias, 2 nA tunneling current.
(Color online) (A) Dots, at 3.25 ML Ag, 50 × 50 nm2 image size. Imaged at −1 V, 2 nA. Two typical profiles are shown on the right. (B–E) Pit, at Ag coverages of 0.5, 1, 2, and 3.3 ML. Images are 50 × 50 nm2, −1 V, 2 nA.
Maximum heights and measured areas of (A) dots and (B) pits. Heights are represented by circles connected with solid lines, and areas by squares with dashed lines. Both values are measured with respect to the surrounding √3. Error bars are not shown to preserve visual clarity. In (A) they are ∼±0.1 nm in height and ±3 nm2 in area. In (B) they are ∼±0.5 nm in height and ±20 nm2 in area. Negative values of height indicate empty dots or pits, i.e., depressions in the surface, whereas positive values indicate protrusions formed by Ag clusters. In each, the dotted horizontal line emphasizes the zero point for the height axis.
(Color online) STM images of a single linear array of dots, before and after Ag deposition on the √3. Both images are 50 × 50 nm2. In both images, some of the intrinsic island–hole boundaries are visible. (A) Linear array of dots patterned on the √3, enclosed by black box. Raw STM image at −0.2 V, 2 nA. (B)Same linear array, enclosed by black lines, after deposition of 3.3 ML Ag on the patterned √3. Three-dimensional view of the STM image at −1 V, 2 nA.
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