(Color online) PL spectra of samples A, B, C, and D measured at 18 K: (a) sample A (SQW reference sample); (b) sample B (with a 7.5-nm-thick GaAs spacer); (b) sample C (with a 15-nm-thick GaAs spacer); (d) sample D (with 7.5-nm-thick GaAs spacer and reduced Bi flux for the second QW growth).
(Color online) PL spectra of DQW sample D at 18 K (black dashed-line) and RT (red solid-line) to show that the sample exhibits a single PL peak at both temperatures.
Schematic of cross-section with growth temperature profile and low magnification bright field cross-sectional TEM image of DQW SCH sample (sample E) to show smooth interfaces between the different layers.
(Color online) Comparison of RT PL spectra of DQW SCH sample (sample E, red solid-line) and SQW SCH reference sample (sample F, black dashed-line) to show high optical quality of the DQW SCH.
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