(Color online) Schematic of the investigated GRINSCH double heterostructure.
(Color online) (a) Near field profile of the optical mode; (b) refractive index profile and calculated intensity of the optical mode.
(Color online) Simulated energy band diagram of the investigated GRINSCH. The polarization induced free carrier concentration in the p- and n-sides of the junction are also shown in this figure.
(Color online) RHEED patterns of 6H-SiC substrate along (a) (1-100) and (b) (11-20) azimuths showing 3 × 1 reconstruction; RHEED pattern of the grown AlN film along (c) (11-20) and (d) (1-100) azimuths showing 2 × 2 surface reconstruction.
(Color online) (a) AFM image of the surface morphology; (b) SEM cross section image of the investigated GRINSCH.
(Color online) (a) XRD θ-2θ scan and (b) the reciprocal lattice map of the (-1015) reflection of the investigated GRINSCH.
TEM cross sectional micrograph of the GRINSCH, as recorded close to the [11-20] projection.
(Color online) Polarization dependent PL spectra at different analyzer angles.
(Color online) (a) CL Spectra under different pumping currents; (b) CL intensity vs pumping current.
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