Coordinate transformation of a curved waveguide to straight waveguide using conformal transformations. (a) Waveguide bend profile after conformal transformation. (b) Waveguide bend profile before conformal transformation.
Waveguide sidewall roughness generated on a straight waveguide.
Edge view of waveguide sidewall roughness of a 25 μm × 50 μm straight waveguide found using Hitachi S4700 fe-SEM.
Attenuation sample size error of a straight waveguide with a roughness of 50 nm RMS and a correlation length of 3 μm.
Losses of manufactured polymer waveguides found using the cutback method.
Waveguide sidewall roughness measured using the Phase Shift MicroXAM IFM. (a) Roughness profile found with the IFM. (b) Autocorrelation of the measured roughness along the direction of light propagation.
Beam propagation method model used for simulation of waveguides with 90° bends.
Comparison of modeled waveguide performance to measured performance.
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