Raman spectra of graphene on SiC(0001) obtained using 532 nm laser line. Inset: detailed feature of 2D band for graphene.
(Color online) Filled-state STM images of graphene on SiC(0001) taken with a current setpoint of 0.05 nA and tip bias of 0.1 V. (a) 300 nm × 300 nm image showing parallel nanoridges prominently aligned vertically across a 0.55 nm horizontal step. A height line profile extracted from the image showing the step height is displayed below the image. (b) 200 nm × 200 nm image shows a zoomed in view of the nanoridges. A height line profile extracted from the image is displayed below.
(Color online) Filled-state 12 nm × 12 nm STM images of graphene grown on SiC(0001) taken in an area with nanoridges using a current setpoint of 0.5 nA and a tip bias of 0.1 V. Both images were acquired simultaneously from the same location using a dual scanning technique, which recorded height data when the STM tip was moving both (a) left to right and (b) right to left. Illustrations of the semimobile sample and the contour recorded by the STM tip as it scans from (c) left to right and (d) right to left.
Width of the area containing an enlarged lattice constant measured from atomic-resolution STM images of graphene on SiC as functions of (a) current setpoint, but with a common scan speed of 72 nm/s and (b) scan speed, but with a common current setpoint of 2 nA.
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