1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Etch-stop method for reliably fabricating sharp yet mechanically stable scanning tunneling microscope tips
Rent:
Rent this article for
USD
10.1116/1.4812796
/content/avs/journal/jvstb/31/4/10.1116/1.4812796
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/31/4/10.1116/1.4812796
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) Schematic of the experimental double-lamella electrochemical tip etching setup, including the application of an etch stop. (b) Photograph of the W wire in an inverted tip holder after it has been fully prepared for etching.

Image of FIG. 2.
FIG. 2.

(Color online) (a) Schematic illustrates how the etch stop was configured relative to the etchant for a series of trial tips. Representative optical micrographs of the results at 10× magnification are displayed below the diagram. (b) and (c) show the same, but at 100× magnification for the optical micrographs. (d) Atomic-resolution STM image of graphite acquired using the tip made with the configuration in (c). [This image was acquired using an Omicron UHV LT-STM operated at room temperature, a tip setpoint bias of 0.1 V and a constant tunneling setpoint current of 0.1 nA.]

Loading

Article metrics loading...

/content/avs/journal/jvstb/31/4/10.1116/1.4812796
2013-07-03
2014-04-17
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Etch-stop method for reliably fabricating sharp yet mechanically stable scanning tunneling microscope tips
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/31/4/10.1116/1.4812796
10.1116/1.4812796
SEARCH_EXPAND_ITEM