1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Optical properties of solution-processed LaAlO x /Si films using spectroscopic ellipsometry
Rent:
Rent this article for
USD
10.1116/1.4813435
/content/avs/journal/jvstb/31/4/10.1116/1.4813435
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/31/4/10.1116/1.4813435

Figures

Image of FIG. 1.
FIG. 1.

(a) Ψ and (b) Δ spectra of the LAO samples with different mole concentrations, obtained at a 60° angle of incidence. The spectra of (a) and (b) are offset by increments of 50 and 100, respectively, relative to the bottom spectra.

Image of FIG. 2.
FIG. 2.

Ellipsometric parameters (a) Ψ and (b) Δ of the 0.09 M LAO film (open dots), together with best-fit curves (solid lines) calculated using the multilayer model.

Image of FIG. 3.
FIG. 3.

Dependence of the film thicknesses and TL band gaps upon mole concentration.

Image of FIG. 4.
FIG. 4.

(a) Real and (b) imaginary parts of the dielectric functions of the LAO films obtained from the data. The spectrum of bulk LaAlO is taken from Ref. .

Tables

Generic image for table
TABLE I.

Properties of the samples.

Loading

Article metrics loading...

/content/avs/journal/jvstb/31/4/10.1116/1.4813435
2013-07-12
2014-04-16
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical properties of solution-processed LaAlOx/Si films using spectroscopic ellipsometry
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/31/4/10.1116/1.4813435
10.1116/1.4813435
SEARCH_EXPAND_ITEM