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Comprehensive characterization of interface and oxide states in metal/oxide/semiconductor capacitors by pulsed mode capacitance and differential isothermal capacitance spectroscopy
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10.1116/1.4865912
/content/avs/journal/jvstb/32/3/10.1116/1.4865912
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/32/3/10.1116/1.4865912
/content/avs/journal/jvstb/32/3/10.1116/1.4865912
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/content/avs/journal/jvstb/32/3/10.1116/1.4865912
2014-02-24
2014-12-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Comprehensive characterization of interface and oxide states in metal/oxide/semiconductor capacitors by pulsed mode capacitance and differential isothermal capacitance spectroscopy
http://aip.metastore.ingenta.com/content/avs/journal/jvstb/32/3/10.1116/1.4865912
10.1116/1.4865912
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