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CuO/ZnO Nanocomposites Investigated by X-ray Photoelectron and X-ray Excited Auger Electron Spectroscopies
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10.1116/11.20111002
/content/avs/journal/sss/17/1/10.1116/11.20111002
http://aip.metastore.ingenta.com/content/avs/journal/sss/17/1/10.1116/11.20111002

Figures

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Accession#01200–01Host MaterialCuO/ZnO nanocompositesTechniqueXPSSpectral Regionsurvey InstrumentPerkin-Elmer Physical Electronics, Inc. 5600ciExcitation SourceMg K α Source Energy1253.6 eVSource Strength350 WSource Size>25 mm × >25 mmAnalyzer Typespherical sectorIncident AngleEmission Angle45°Analyzer Pass Energy187.85 eVAnalyzer Resolution1.9 eVTotal Signal Accumulation Time825.7 sTotal Elapsed Time908.3 sNumber of Scans30Effective Detector Width1.9 eV

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  • Accession #:01200–02

  • Host Material: CuO/ZnO nanocomposites

  • Technique: XPS

  • Spectral Region: C 1s

  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci

  • Excitation Source: Mg K α

  • Source Energy: 1253.6 eV

  • Source Strength: 350 W

  • Source Size: >25 mm × >25 mm

  • Analyzer Type: spherical sector

  • Incident Angle: 9°

  • Emission Angle: 45°

  • Analyzer Pass Energy: 58.7 eV

  • Analyzer Resolution: 0.6 eV

  • Total Signal Accumulation Time: 45.3 s

  • Total Elapsed Time: 49.8 s

  • Number of Scans: 6

  • Effective Detector Width: 0.6 eV

  • Comment: See footnote below the Spectral Features Table.

Image of Untitled

  • Accession #:01200–03

  • Host Material: CuO/ZnO nanocomposites

  • Technique: XPS

  • Spectral Region: O 1s

  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci

  • Excitation Source: Mg K α

  • Source Energy: 1253.6 eV

  • Source Strength: 350 W

  • Source Size: >25 mm × >25 mm

  • Analyzer Type: spherical sector

  • Incident Angle: 9°

  • Emission Angle: 45°

  • Analyzer Pass Energy: 58.7 eV

  • Analyzer Resolution: 0.6 eV

  • Total Signal Accumulation Time: 45.3 s

  • Total Elapsed Time: 49.8 s

  • Number of Scans: 6

  • Effective Detector Width: 0.6 eV

  • Comment: See footnote below the Spectral Features Table.

Image of Untitled

  • Accession #:01200–04

  • Host Material: CuO/ZnO nanocomposites

  • Technique: XPS

  • Spectral Region: Zn 2p3/2

  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci

  • Excitation Source: Mg K α

  • Source Energy: 1253.6 eV

  • Source Strength: 350 W

  • Source Size: >25 mm × >25 mm

  • Analyzer Type: spherical sector

  • Incident Angle: 9°

  • Emission Angle: 45°

  • Analyzer Pass Energy: 58.7 eV

  • Analyzer Resolution: 0.6 eV

  • Total Signal Accumulation Time: 151.0 s

  • Total Elapsed Time: 166.1 s

  • Number of Scans: 20

  • Effective Detector Width: 0.6 eV

  • Comment: See footnote below the Spectral Features Table.

Image of Untitled

  • Accession #:01200–05

  • Host Material: CuO/ZnO nanocomposites

  • Technique: XPS

  • Spectral Region: Zn LMM

  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci

  • Excitation Source: Mg K α

  • Source Energy: 1253.6 eV

  • Source Strength: 350 W

  • Source Size: >25 mm × >25 mm

  • Analyzer Type: spherical sector

  • Incident Angle: 9°

  • Emission Angle: 45°

  • Analyzer Pass Energy: 58.7 eV

  • Analyzer Resolution: 0.6 eV

  • Total Signal Accumulation Time: 241.2 s

  • Total Elapsed Time: 265.3 s

  • Number of Scans: 24

  • Effective Detector Width: 0.6 eV

  • Comment: See footnote below the Spectral Features Table.

Image of Untitled

  • Accession #:01200–06

  • Host Material: CuO/ZnO nanocomposites

  • Technique: XPS

  • Spectral Region: Cu 2p

  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci

  • Excitation Source: Mg K α

  • Source Energy: 1253.6 eV

  • Source Strength: 350 W

  • Source Size: >25 mm × >25 mm

  • Analyzer Type: spherical sector

  • Incident Angle: 9°

  • Emission Angle: 45°

  • Analyzer Pass Energy: 58.7 eV

  • Analyzer Resolution: 0.6 eV

  • Total Signal Accumulation Time: 150.3 s

  • Total Elapsed Time: 165.3 s

  • Number of Scans: 6

  • Effective Detector Width: 0.6 eV

  • Comment: See footnote below the Spectral Features Table.

Image of Untitled

  • Accession #:01200–07

  • Host Material: CuO/ZnO nanocomposites

  • Technique: XPS

  • Spectral Region: Cu LMM

  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci

  • Excitation Source: Mg K α

  • Source Energy: 1253.6 eV

  • Source Strength: 350 W

  • Source Size: >25 mm × >25 mm

  • Analyzer Type: spherical sector

  • Incident Angle: 9°

  • Emission Angle: 45°

  • Analyzer Pass Energy: 58.7 eV

  • Analyzer Resolution: 0.6 eV

  • Total Signal Accumulation Time: 60.3 s

  • Total Elapsed Time: 66.3 s

  • Number of Scans: 6

  • Effective Detector Width: 0.6 eV

  • Comment: See footnote below the Spectral Features Table.

Tables

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SPECTRAL FEATURES TABLE

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ANALYZER CALIBRATION TABLE

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GUIDE TO FIGURES

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/content/avs/journal/sss/17/1/10.1116/11.20111002
2012-02-13
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: CuO/ZnO Nanocomposites Investigated by X-ray Photoelectron and X-ray Excited Auger Electron Spectroscopies
http://aip.metastore.ingenta.com/content/avs/journal/sss/17/1/10.1116/11.20111002
10.1116/11.20111002
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