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Fluorine-Doped Iron Oxide Nanomaterials by Plasma Enhanced-CVD: An XPS Study
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10.1116/11.20130101
/content/avs/journal/sss/20/1/10.1116/11.20130101
http://aip.metastore.ingenta.com/content/avs/journal/sss/20/1/10.1116/11.20130101

Figures

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Accession# 01248–01
FeO by PE-CVD
XPS
survey
Perkin-Elmer Physical Electronics, Inc. 5600ci
Al
1486.6 eV
200 W
>25 mm × >25 mm
spherical sector
45°
187.85 eV
1.9 eV
101.3 s
111.5 s
3
1.9 eV
The strong overlap between Fe LMM and F KVV peaks prevents from an unambiguous identification of the latter signal.

Image of Untitled

  • •  01248–02
  • •  FeO by PE-CVD
  • •  XPS
  • •  C 1
  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci
  • Excitation Source: Al
  • Source Energy: 1486.6 eV
  • Source Strength: 200 W
  • Source Size: >25 mm × >25 mm
  • Analyzer Type: spherical sector
  • Incident Angle: 9°
  • Emission Angle: 45°
  • Analyzer Pass Energy: 58.70 eV
  • Analyzer Resolution: 0.6 eV
  • Total Signal Accumulation Time: 241.2 s
  • Total Elapsed Time: 265.3 s
  • Number of Scans: 24
  • Effective Detector Width: 0.6 eV
  • Comment: See footnote below the Spectral Features Table.

Image of Untitled

  • •  01248–03
  • •  FeO by PE-CVD
  • •  XPS
  • •  O 1
  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci
  • Excitation Source: Al
  • Source Energy: 1486.6 eV
  • Source Strength: 200 W
  • Source Size: >25 mm × >25 mm
  • Analyzer Type: spherical sector
  • Incident Angle: 9°
  • Emission Angle: 45°
  • Analyzer Pass Energy: 58.70 eV
  • Analyzer Resolution: 0.6 eV
  • Total Signal Accumulation Time: 60.3 s
  • Total Elapsed Time: 66.3 s
  • Number of Scans: 6
  • Effective Detector Width: 0.6 eV
  • Comment: See footnote below the Spectral Features Table.

Image of Untitled

  • •  01248–04
  • •  FeO by PE-CVD
  • •  XPS
  • •  Fe 2
  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci
  • Excitation Source: Al
  • Source Energy: 1486.6 eV
  • Source Strength: 200 W
  • Source Size: >25 mm × >25 mm
  • Analyzer Type: spherical sector
  • Incident Angle: 9°
  • Emission Angle: 45°
  • Analyzer Pass Energy: 58.70 eV
  • Analyzer Resolution: 0.6 eV
  • Total Signal Accumulation Time: 360.8 s
  • Total Elapsed Time: 396.9 s
  • Number of Scans: 16
  • Effective Detector Width: 0.6 eV
  • Comment: See footnote below the Spectral Features Table.

Image of Untitled

  • •  01248–05
  • •  FeO by PE-CVD
  • •  XPS
  • •  F 1
  • Instrument: Perkin-Elmer Physical Electronics, Inc. 5600ci
  • Excitation Source: Al
  • Source Energy: 1486.6 eV
  • Source Strength: 200 W
  • Source Size: >25 mm × >25 mm
  • Analyzer Type: spherical sector
  • Incident Angle: 9°
  • Emission Angle: 45°
  • Analyzer Pass Energy: 58.70 eV
  • Analyzer Resolution: 0.6 eV
  • Total Signal Accumulation Time: 120.6 s
  • Total Elapsed Time: 132.7 s
  • Number of Scans: 12
  • Effective Detector Width: 0.6 eV
  • Comment: See footnote below the Spectral Features Table.

Tables

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SPECTRAL FEATURES TABLE

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ANALYZER CALIBRATION TABLE

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GUIDE TO FIGURES

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/content/avs/journal/sss/20/1/10.1116/11.20130101
2013-04-24
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Fluorine-Doped Iron Oxide Nanomaterials by Plasma Enhanced-CVD: An XPS Study
http://aip.metastore.ingenta.com/content/avs/journal/sss/20/1/10.1116/11.20130101
10.1116/11.20130101
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