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nanosystems synthesized by a hybrid CVD/sputtering route, and analyzed by X-ray photoelectron spectroscopy
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nanosystems have been grown on metallic Ti substrates by a hybrid chemical vapor deposition
(CVD) / Radio Frequency (RF)-sputtering route. The obtained specimens have been characterized in their structure, morphology and chemical composition by means of X-ray diffraction
(XRD), field emission-scanning electron microscopy (FE-SEM), secondary ion mass spectrometry
(SIMS) and X-ray photoelectron spectroscopy
(XPS). Herein, a detailed XPS investigation of a representative sample is proposed. In addition to the wide scan spectrum, particular attention is dedicated to the analysis of O 1s, Fe 2p, W 4f, and W 4d core levels. The obtained results suggested the formation of pure Fe2O3-WO3
composites, in which each oxide maintained its chemical identity.
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