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Surface Science Spectra Editor receives ECASIA award

16th European Conference on Applications of Surface and Interface Analysis (ECASIA’15) Granada, Spain. September 28th - October 1st, 2015

Plenary lectures and ECASIA award

Prof. James Castle, (ECASIA’15 award)

Department of Mechanical Engineering Sciences, FEPS, University of Surrey, UK
“Beyond Binding Energy: The use of Secondary Features in the XP Spectrum”

Thursday, October 1st, 2015 (9:00 - 10:00)
ECASIA’15 award:


Jim CastleThe ECASIA Prize Committee has selected Professor J.E. Castle, Department of Mechanical Engineering Sciences, University of Surrey, UK, for the 2015 ECASIA Award for his lifetime achievements in surface science and surface analysis, with strong applications to the power industry. Professor J. E. Castle has been a key player worldwide in surface and interface analysis from the early beginnings and made major contributions during several decades. In the 1960’s, he was among the first to recognise the importance of XPS for corrosion science, and purchased an XPS prototype instrument. In the 1970’s he developed XPS facilities for in situ oxidation and carburisation of alloys, and introduced higher energy excitation X-ray sources. In the 1990’s, Professor J.E. Castle used AES for detailed studies of pitting corrosion, and the work of his group during that period was also characterised by a diversification into many areas of materials science. Last but not least, beginning in the 2000’s Professor J.E. Castle studied intrinsic backgrounds in XPS and started to develop an expert system for the evaluation of survey scan XPS data aiming on quick and easy identification of corrosion and contamination of metal surfaces. Professor J.E. Castle’s contributions to standardization under ISO TC 201 and his activity as Editor of Surface Science Spectra are highly recognized by the community in surface and interface analysis.


ToFSIMS Spectra in SSS


It’s here! – The web based submission form for ToFSIMS submissions is up and running. This new submission process closely parallels the well-loved form for the electron spectroscopies. The on-line forms, developed by a team of AVS SIMS enthusiasts, allow for the provisions of all instrument details and settings used for the data acquisitions. The Editors of SSS plan to mark and honor the effort of all those involved, in bringing this long-awaited development to completion, with a special ToFSIMS issue within the current volume. To have a place in this issue please prepare submissions by using the dedicated SIMS log-in to be found alongside the XPS. At present you need to register for this even if you are already registered for XPS/Auger submissions. As with the electron submissions, those interested in your data will be able to download the full set of data with a single click on the spectrum accession number. Please do make the effort to submit your data and help make the SIMS issue a memorable one.


Comprehensive surface chemical analysis vocabulary and terminology available

Is your message clear?
The vocabulary of surface chemical analysis

The loss of the Mars Climate Orbiter was the result of a miscommunication—the failure to recognize that information was needed in newton seconds and not as pound-force seconds. Although scientific advancement and technology reliability require clear and unambiguous communication, papers, reports and vendor specifications frequently use terminology in inconsistent or incorrect ways. If you have ever wondered when to use ‘attenuation length’ rather than ‘inelastic mean free path’ or ‘dose’ rather than ‘fluence,’ then you will appreciate access to an authoritative vocabulary.

A comprehensive set of surface chemical analysis vocabulary and terminology has been made available at no cost in order to help minimize some of the confusion and inconsistencies present in describing the analysis of surfaces. Developed by the ISO Technical Committee 201, the vocabulary can be accessed through the websites of five educationally focused organizations, one of which is the AVS. It is the hope of the ISO TC201 committee that making the terminology freely available as a resource for researchers, editors, authors and reviewers will help minimize the inconsistent and sometimes contradictory uses of terminology in the literature.

The ISO TC201 vocabulary, developed with considerable input from AVS members includes definitions of methods and important terminology for surface analysis, scanned probe methods and data treatment methods, such as multivariate analysis. The terminology is structured in two parts:

  • ISO18115-1:2010 – Surface chemical analysis – Vocabulary –Part 1, General terms and terms used in spectroscopy
  • ISO18115-1:2010 – Surface chemical analysis – Vocabulary –Part 1, General terms and terms used in spectroscopy

Additional information, indices of terms and access to the vocabulary can be found through any of the links below:

  1. http://www.avs.org/Education-Outreach/Technical-Resources
  2. http://www.emsl.pnl.gov/capabilities/spectroscopy/surface_analysis/
  3. http://www.npl.co.uk/science-technology/surface-and-nanoanalysis/research/international-standardisation-and-traceability/vocabulary-of-some-800-terms-for-surface-chemical-analysis-iso
  4. http://www.aist.go.jp/aist_e/aist_laboratories/6metrology/iso.html

If you have suggestions for terms or concepts that need to be added to these documents, please send them to Alex Shard (alex.shard@npl.co.uk).


Digital Data Download

While not a new feature of SSS, the ability to download the digital data entered in the database is definitely a feature that deserves highlighting. Beginning with Volume 9 of SSS and continuing through the present, when viewing the PDF of an SSS data record online, you can click on the blue accession number located in the caption of each figure to download the digital data.

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