Theoretical and Applied Mechanics Letters
Principle of the electron Moiré method15,16 (modified).
An example of the electron Moiré fringe caused by the difference of the emitted electrons.15
Schematic diagram of model grid by electron beam lithography15,16 (modified).
Scanning electron microscope image fabricated by electron beam lithography15(modified).
Micro-grids fabricated by femto-second laser exposure, (a): parallel lines observed by an electron beam microscope (SEM), (b): cross grid observed by SEM32 (modified).
Electron Moiré fringe of the pure copper specimen crept for 90 h; (a) and (b), 140 h; (c) and (d) and 165 h; (e) and (f)15,16(modified).
Strain distribution of the pure copper specimen crept for 90 h; (a) and (b), 140 h; (c) and (d), 165 h; (e) and (f)5,16(modified). (a) , Crept for 90 h. (b) , Crept for 90 h. (c) , Crept for 140 h. (d) , Crept for 140 h. (e) , Crept for 165 h. (f) , Crept for 165 h.
Image of electron Moiré fringe (a), an SEM image (b), and the distribution of the grain boundary sliding (c) and (d)16 (modified).
Moiré fringe pattern around the hole after pushing fiber out produced by the electron beam scan in the x direction (a) and the y direction (b)37 (modified).
Residual stress distribution around a fiber in a fiber reinforced metal37 (modified).
Article metrics loading...
Full text loading...