Theoretical and Applied Mechanics Letters

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Electron Moiré method
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Image of Fig. 1.
Fig. 1.

Principle of the electron Moiré method15,16 (modified).

Image of Fig. 2.
Fig. 2.

An example of the electron Moiré fringe caused by the difference of the emitted electrons.15

Image of Fig. 3.
Fig. 3.

Schematic diagram of model grid by electron beam lithography15,16 (modified).

Image of Fig. 4.
Fig. 4.

Scanning electron microscope image fabricated by electron beam lithography15(modified).

Image of Fig. 5.
Fig. 5.

Micro-grids fabricated by femto-second laser exposure, (a): parallel lines observed by an electron beam microscope (SEM), (b): cross grid observed by SEM32 (modified).

Image of Fig. 6.
Fig. 6.

Electron Moiré fringe of the pure copper specimen crept for 90 h; (a) and (b), 140 h; (c) and (d) and 165 h; (e) and (f)15,16(modified).

Image of Fig. 7.
Fig. 7.

Strain distribution of the pure copper specimen crept for 90 h; (a) and (b), 140 h; (c) and (d), 165 h; (e) and (f)5,16(modified). (a) , Crept for 90 h. (b) , Crept for 90 h. (c) , Crept for 140 h. (d) , Crept for 140 h. (e) , Crept for 165 h. (f) , Crept for 165 h.

Image of Fig. 8.
Fig. 8.

Image of electron Moiré fringe (a), an SEM image (b), and the distribution of the grain boundary sliding (c) and (d)16 (modified).

Image of Fig. 9.
Fig. 9.

Moiré fringe pattern around the hole after pushing fiber out produced by the electron beam scan in the x direction (a) and the y direction (b)37 (modified).

Image of Fig. 10.
Fig. 10.

Residual stress distribution around a fiber in a fiber reinforced metal37 (modified).


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Scitation: Electron Moiré method