1887

Lashkaryov Institute of Semiconductor Physics NAS Ukraine

This disambiguated institution page maps multiple name variations to a unique institution profile. We have done our best to disambiguate these multiple variations properly, and feedback is always appreciated. If there are errors on this page, please contact help@scitation.org.
(/content/aip/journal/jap/100/8/10.1063/1.2357837 OR /content/aip/journal/jap/101/3/10.1063/1.2434821 OR /content/aip/journal/apl/87/19/10.1063/1.2128067 OR /content/aip/journal/jap/113/18/10.1063/1.4801959 OR /content/aip/journal/jap/112/12/10.1063/1.4770475 OR /content/aip/journal/jap/99/11/10.1063/1.2198940 OR /content/aip/proceeding/aipcp/10.1063/1.2134645 OR /content/aip/journal/jap/76/2/10.1063/1.357843 OR /content/aip/journal/jap/97/9/10.1063/1.1893211 OR /content/aip/journal/jap/77/4/10.1063/1.358947 OR /content/aip/journal/apl/89/19/10.1063/1.2378526 OR /content/avs/journal/jvstb/30/4/10.1116/1.4732117 OR /content/avs/journal/jvstb/24/2/10.1116/1.2183787 OR /content/aip/journal/jap/96/11/10.1063/1.1808900 OR /content/aip/journal/jap/80/7/10.1063/1.363307 OR /content/aip/journal/jap/98/11/10.1063/1.2138380 OR /content/aip/journal/rsi/83/6/10.1063/1.4727869 OR /content/aip/journal/apl/91/17/10.1063/1.2802567 OR /content/aip/journal/jap/109/9/10.1063/1.3580478 OR /content/aip/journal/jap/93/11/10.1063/1.1570502 OR /content/aip/journal/apl/91/20/10.1063/1.2813615 OR /content/aip/journal/jap/112/1/10.1063/1.4736558 OR /content/aip/journal/jap/102/11/10.1063/1.2818370 OR /content/aip/proceeding/aipcp/10.1063/1.4848519 OR /content/aip/journal/apl/103/3/10.1063/1.4816014 OR /content/aip/journal/apl/90/14/10.1063/1.2720758 OR /content/aip/proceeding/aipcp/10.1063/1.2759670 OR /content/aip/journal/apl/90/15/10.1063/1.2721126 OR /content/aip/journal/apl/75/17/10.1063/1.125095 OR /content/aip/journal/apl/94/21/10.1063/1.3148645 OR /content/aip/journal/jap/78/3/10.1063/1.360173 OR /content/aip/journal/jap/115/5/10.1063/1.4863599 OR /content/aip/journal/apl/71/26/10.1063/1.120530 OR /content/aip/journal/jap/102/1/10.1063/1.2749463 OR /content/aip/journal/jap/94/7/10.1063/1.1604452 OR /content/aip/journal/jap/77/8/10.1063/1.359515 OR /content/aip/journal/apl/99/8/10.1063/1.3627183 OR /content/aip/proceeding/aipcp/10.1063/1.3140425 OR /content/aip/journal/apl/89/5/10.1063/1.2236467 OR /content/avs/journal/jvstb/17/2/10.1116/1.590617 OR /content/aip/journal/jap/113/14/10.1063/1.4801794 OR /content/aip/proceeding/aipcp/10.1063/1.2729995 OR /content/aip/journal/jap/108/7/10.1063/1.3485831 OR /content/aip/journal/jap/97/4/10.1063/1.1847724 OR /content/aip/journal/jap/109/6/10.1063/1.3556738 OR /content/aip/journal/jap/99/11/10.1063/1.2198935 OR /content/aip/journal/jcp/115/17/10.1063/1.1408916 OR /content/aip/journal/apl/95/3/10.1063/1.3180703 OR /content/aip/journal/apl/101/8/10.1063/1.4747334 OR /content/aip/journal/jap/100/5/10.1063/1.2345464 OR /content/aip/journal/rsi/82/8/10.1063/1.3626902 OR /content/aip/journal/apl/91/22/10.1063/1.2817752 OR /content/aip/proceeding/aipcp/10.1063/1.2138620 OR /content/aip/journal/jap/85/3/10.1063/1.369316 OR /content/aip/journal/apl/84/18/10.1063/1.1738518 OR /content/aip/journal/jap/98/11/10.1063/1.2134887 OR /content/aip/journal/apl/97/11/10.1063/1.3486124 OR /content/aip/journal/jap/104/8/10.1063/1.3003079 OR /content/aip/journal/apl/90/21/10.1063/1.2742900 OR /content/aip/journal/jap/79/2/10.1063/1.360893 OR /content/aip/journal/jap/103/8/10.1063/1.2903144 OR /content/aip/journal/jap/100/12/10.1063/1.2405122 OR /content/aip/journal/rsi/79/9/10.1063/1.2976033 OR /content/aip/journal/jap/98/6/10.1063/1.2060956 OR /content/aip/journal/jap/102/7/10.1063/1.2785824 OR /content/avs/journal/jvstb/30/2/10.1116/1.3692253 OR /content/aip/journal/apl/92/20/10.1063/1.2931704 OR /content/aip/journal/apl/88/21/10.1063/1.2207833 OR /content/aip/journal/apl/91/13/10.1063/1.2790814 OR /content/aip/journal/jap/103/12/10.1063/1.2946446 OR /content/aip/proceeding/aipcp/10.1063/1.2730036 OR /content/aip/journal/apl/73/2/10.1063/1.121760 OR /content/aip/journal/jap/105/9/10.1063/1.3125274 OR /content/aip/proceeding/aipcp/10.1063/1.3140453 OR /content/aip/journal/jap/114/17/10.1063/1.4829702 OR /content/aip/journal/apl/100/14/10.1063/1.3701152 OR /content/aip/journal/jap/113/6/10.1063/1.4790712 OR /content/aip/journal/jap/110/4/10.1063/1.3626820 OR /content/aip/journal/jap/103/1/10.1063/1.2829820 OR /content/aip/journal/jap/96/10/10.1063/1.1805719 OR /content/aip/journal/jap/99/2/10.1063/1.2163009 OR /content/aip/journal/jap/96/11/10.1063/1.1811388 OR /content/aip/journal/jcp/120/12/10.1063/1.1650290 OR /content/aip/journal/jap/109/2/10.1063/1.3533770 OR /content/aip/proceeding/aipcp/10.1063/1.2759632 OR /content/aip/journal/jap/110/5/10.1063/1.3634118 OR /content/aip/journal/rsi/81/4/10.1063/1.3378287 OR /content/aip/journal/apl/99/14/10.1063/1.3644981 OR /content/aip/journal/apl/102/13/10.1063/1.4800936 OR /content/aip/journal/jap/100/1/10.1063/1.2213172 OR /content/aip/journal/jap/109/11/10.1063/1.3594682 OR /content/avs/journal/jvsta/14/4/10.1116/1.580035 OR /content/aip/journal/apl/89/20/10.1063/1.2390655 OR /content/aip/journal/jap/110/11/10.1063/1.3660795 OR /content/aip/proceeding/aipcp/10.1063/1.4848455 OR /content/aip/journal/apl/96/10/10.1063/1.3358131 OR /content/aip/proceeding/aipcp/10.1063/1.3140434 OR /content/aip/journal/apl/83/18/10.1063/1.1625777 OR /content/aip/journal/jap/106/11/10.1063/1.3264733 OR /content/aip/journal/jap/99/7/10.1063/1.2188048 OR /content/aip/journal/apl/94/1/10.1063/1.3056653 OR /content/avs/journal/jvstb/14/3/10.1116/1.588885 OR /content/aip/journal/jap/112/4/10.1063/1.4745015 OR /content/aip/journal/jap/101/2/10.1063/1.2427105 OR /content/aip/journal/jap/112/8/10.1063/1.4759277 OR /content/aip/proceeding/aipcp/10.1063/1.3140446 OR /content/avs/journal/jvstb/30/2/10.1116/1.3693977 OR /content/aip/journal/apl/97/21/10.1063/1.3521277 OR /content/aip/journal/apl/101/24/10.1063/1.4771986 OR /content/aip/proceeding/aipcp/10.1063/1.3140482 OR /content/aip/proceeding/aipcp/10.1063/1.3295551 OR /content/aip/proceeding/aipcp/10.1063/1.2036762 OR /content/aip/journal/jap/109/12/10.1063/1.3599892 OR /content/aip/journal/jap/93/10/10.1063/1.1564280 OR /content/avs/journal/jvstb/32/2/10.1116/1.4843715 OR /content/avs/journal/jvsta/15/1/10.1116/1.580454 OR /content/aip/journal/apl/89/15/10.1063/1.2360914 OR /content/aip/journal/apl/73/17/10.1063/1.122476 OR /content/aip/journal/jap/98/5/10.1063/1.2039271 OR /content/aip/journal/jap/95/8/10.1063/1.1686898 OR /content/aip/proceeding/aipcp/10.1063/1.2138623 OR /content/aip/journal/jap/114/14/10.1063/1.4824066 OR /content/aip/journal/apl/82/12/10.1063/1.1563730 OR /content/aip/journal/jap/92/9/10.1063/1.1512698 OR /content/aip/journal/apl/101/8/10.1063/1.4748362 OR /content/aip/journal/jap/111/8/10.1063/1.3702850 OR /content/aip/journal/jap/85/6/10.1063/1.369684 OR /content/avs/journal/jvstb/21/1/10.1116/1.1528918 OR /content/avs/journal/jvstb/17/2/10.1116/1.590612 OR /content/aip/journal/apl/92/18/10.1063/1.2919792 OR /content/aip/journal/apl/78/14/10.1063/1.1360227 OR /content/aip/proceeding/aipcp/10.1063/1.2036776 OR /content/aip/journal/jcp/110/1/10.1063/1.478106 OR /content/aip/journal/jap/108/8/10.1063/1.3499610 OR /content/aip/journal/jap/94/3/10.1063/1.1589591 OR /content/aip/journal/apl/89/9/10.1063/1.2337279 OR /content/aip/journal/apl/102/24/10.1063/1.4811373 OR /content/aip/journal/apl/101/18/10.1063/1.4766170 OR /content/aip/journal/apl/82/16/10.1063/1.1569039 OR /content/aip/journal/apl/97/25/10.1063/1.3529470 OR /content/aip/journal/apl/103/4/10.1063/1.4816589 OR /content/avs/journal/jvstb/31/4/10.1116/1.4810782 OR /content/aip/journal/apl/88/23/10.1063/1.2206992 OR /content/aip/proceeding/aipcp/10.1063/1.3659859 OR /content/aip/proceeding/aipcp/10.1063/1.44536)
Loading
This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
8f0d35baff1d7acc18fed827cacf384f institution.institutionzxybnytfddd
Scitation: Lashkaryov Institute of Semiconductor Physics NAS Ukraine
http://aip.metastore.ingenta.com/content/institution/AF0005750