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Verifying the diode–capacitor circuit voltage decay

American Journal of Physics -- August 2003 -- Volume 71, Issue 8, pp. 797-800

Issue Date: August 2003
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KEYWORDS and PACS

Keywords
PACS
  • 01.50.-i
    Educational aids
  • 84.30.Bv
    Circuit theory including computer-aided circuit design and analysis
  • 84.32.Tt
    Capacitors
  • YEAR: 2003

PUBLICATION DATA

ISSN:
0002-9505 (print)  
Publisher:
AIP is a member of CrossRef AAPT
Edward H. Hellen
Department of Physics and Astronomy, University of North Carolina at Greensboro, Greensboro, North Carolina 27402
The voltage on a capacitor discharging through a forward biased diode is calculated from basic equations and is found to be in good agreement with experimental measurements. In contrast to the exponential time decay for a RC circuit, the nonlinear characteristics of the diode result in a nonexponential decay for the diode–capacitor circuit. For a silicon diode the decay is predominantly a logarithmic function of time. ©2003 American Association of Physics Teachers.
History: Received 14 January 2003; accepted 2 April 2003
Permalink: http://dx.doi.org/10.1119/1.1578070

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