Experimental observations of L- and M-shell spectra emitted from plasmas produced by the irradiation of solid targets with single 3.5 ps, KrF laser pulses
L- and M-shell x-ray spectra obtained when solid targets were irradiated by single, 3.5 ps, KrF laser pulses with irradiances above 1016 W cm−2 are presented. Modeling of the experimental condit...
L- and M-shell x-ray spectra obtained when solid targets were irradiated by single, 3.5 ps, KrF laser pulses with irradiances above 1016 W cm−2 are presented. Modeling of the experimental condit...
Selective low-pressure chemical vapor deposition of Si1−xGex alloys in a rapid thermal processor using dichlorosilane and germane
Low-pressure chemical vapor deposition of Si1−xGex alloys in a cold wall, lamp-heated rapid thermal processor was studied. Alloys were deposited using the reactive gases GeH4 and SiH2Cl2 in a hy...
Low-pressure chemical vapor deposition of Si1−xGex alloys in a cold wall, lamp-heated rapid thermal processor was studied. Alloys were deposited using the reactive gases GeH4 and SiH2Cl2 in a hy...
Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
Appl. Phys. Lett. 57, 2089 (1990); doi:10.1063/1.103950
Issue Date: 12 November 1990
You are not logged in to this journal. Log in
An atomic force microscope capable of measuring, simultaneously yet separately, lateral (``frictional'') and normal forces is described. A direction-dependent feature, absent in topological images, is found when scanning stepped surfaces of NaCl (001) in ultrahigh vacuum. A simple model is presented to account for this observation.
Applied Physics Letters is copyrighted by The American Institute of Physics.
| History: | Received 16 July 1990; accepted 20 August 1990 |
| Permalink: |
http://link.aip.org/link/?APPLAB/57/2089/1 |
| BUY THIS ARTICLE | (US$28) |
|
|
Connotea
CiteULike
del.icio.us
BibSonomy
KEYWORDS and PACS
- 46.30.Rc
Classical mechanics and rheology Mechanics and rheology (including stability and structural mechanics of shells, plates, and beams) Measurement methods and techniques - 68.35.Bs
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Solid surfaces and solid
solid interfaces (including bicrystals)
Geometry; atomic and molecular orientation; crystal shapes; surface topography
- 06.70.-h
Measurement science, general laboratory techniques, and instrumentation systems General instrumentation - 81.40.Pq
Materials science Treatment of materials and its effects on microstructure and properties Friction, lubrication, and wear - YEAR: 1990
RELATED DATABASES
PUBLICATION DATA
0003-6951 (print)
1077-3118 (online)
AIP
REFERENCES (8)
For access to fully linked references, you need to log in.
For access to fully linked references, you need to Log in.
- G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
- G. Meyer and N. M. Amer, Appl. Phys. Lett. 56, 2100 (1990).
- In addition, lateral bending of the cantilever, in the x-y plane, may occur. However, when currently available microfabricated cantilevers are used, no orientational change in the direction of the reflected laser beam is to be expected. Nevertheless, with the proper cantilever design, lateral bending can be detected with the optical beam deflection approach.
- Silicon Detector Corp., Newbury Park, CA 91320.
- H. Bethge and K. W. Keller,
J. Cryst. Growth 23, 105 (1974 ), and references therein. - U. Landman, W. D. Luedtke, and M. W. Ribarsky,
J. Vac. Sci. Technol. A 7, 2829 (1989 ). - The absolute values of the measured forces depend critically on the tip length. Since the exact tip length was not measured after scanning, the values reported here have an estimated uncertainty of a factor of 2.
- J. B. Pethica and W. C. Oliver, Physica Scripta. T 19, 61 (1987).
